By Andreas Kerber, Eduard Cartier (auth.), Tibor Grasser (eds.)
This booklet presents a single-source connection with one of many more difficult reliability concerns plaguing glossy semiconductor applied sciences, damaging bias temperature instability. Readers will take advantage of state-of-the paintings assurance of analysis in subject matters resembling time established disorder spectroscopy, anomalous illness habit, stochastic modeling with extra metastable states, multiphonon conception, compact modeling with RC ladders and implications on machine reliability and lifetime.
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