Advances in layout tools and procedure applied sciences have led to a continuing bring up within the complexity of built-in circuits (ICs). although, the elevated complexity and nanometer-size gains of recent ICs lead them to liable to production defects, in addition to functionality and caliber matters. Testing for Small-Delay Defects in Nanoscale CMOS built-in Circuits covers universal difficulties in components resembling approach diversifications, energy offer noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The publication additionally addresses checking out for small-delay defects (SDDs), which may reason quick timing mess ups on either severe and non-critical paths within the circuit.
- Overviews semiconductor attempt demanding situations and the necessity for SDD trying out, together with easy thoughts and introductory fabric
- Describes algorithmic suggestions integrated in advertisement instruments from Mentor Graphics
- Reviews SDD trying out in keeping with "alternative tools" that explores new metrics, top-off ATPG, and circuit topology-based solutions
- Highlights the benefits and downsides of a various set of metrics, and identifies scope for improvement
Written from the triple standpoint of college researchers, EDA device builders, and chip designers and gear clients, this ebook is the 1st of its variety to handle all points of SDD checking out from any such assorted point of view. The publication is designed as a one-stop reference for present business practices, learn demanding situations within the area of SDD checking out, and up to date advancements in SDD solutions.
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